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Handbook of microwave component measurements : with advanced VNA techniques
Dunsmore, Joel P.
- ISBN:9781119979555
- Call Number : TK 7876 .D84 2012
- Main Entry: Dunsmore, Joel P.
- Title:Handbook of microwave component measurements : with advanced VNA techniques [electronic resource] / Joel P. Dunsmore.
- Publisher:Chichester : John Wiley & Sons Inc., 2012.
- Physical Description:xxiii, 611 p.: ill.; 25 cm
- Notes:Includes bibliographical references and index
- Subject:Microwave devices -- Testing.
Handbook of microwave component measurements with advanced
- HANDBOOK OF MICROWAVE COMPONENT MEASUREMENTS
- Contents
- Foreword
- Preface
- Acknowledgments
- List of Acronyms
- 1 Introduction to Microwave Measurements
- 1.1 Modern Measurement Process
- 1.2 A Practical Measurement Focus
- 1.3 Definition of Microwave Parameters
- 1.4 Power Parameters
- 1.5 Noise Figure and Noise Parameters
- 1.6 Distortion Parameters
- 1.7 Characteristics of Microwave Components
- 1.8 Passive Microwave Components
- 1.9 Filters
- 1.10 Directional Couplers
- 1.11 Circulators and Isolators
- 1.12 Antennas
- 1.13 PCB Components
- 1.14 Active Microwave Components
- 1.15 Measurement Instrumentation
- References
- 2 VNA Measurement Systems
- 3 Calibration and Vector Error Correction
- 3.1 Introduction
- 3.2 Basic Error Correction for S-Parameters: Cal Application
- 3.3 Determining Error Terms: Cal Acquisition for 12-Term Models
- 3.4 Determining Error Terms: Cal Acquisition for Eight-Term Models
- 3.5 Waveguide Calibrations
- 3.6 Calibration for Source Power
- 3.7 Calibration for Receiver Power
- 3.8 Devolved Calibrations
- 3.9 Determining Residual Errors
- 3.10 Computing Measurement Uncertainties
- 3.11 S21 or Transmission Uncertainty
- 3.12 Errors in Phase
- 3.13 Practical Calibration Limitations
- 3.13.1 Cable Flexure
- 3.13.2 Changing Power after Calibration
- 3.13.3 Compensating for Step Attenuator Changes in Step Attenuators
- 3.13.4 Connector Repeatability
- 3.13.5 Noise Effects
- 3.13.6 Drift: Short-Term and Long-Term
- 3.13.7 Interpolation of Error Terms
- 3.13.8 Calibration Quality: Electronic vs Mechanical Kits
- References
- 4 Time Domain Transforms
- 4.1 Introduction
- 4.2 The Fourier Transform
- 4.3 The Discrete Fourier Transform
- 4.4 Fourier Transform (Analytic) vs VNA Time Domain Transform
- 4.5 Low-Pass and Band-Pass Transforms
- 4.6 Time Domain Gating
- 4.7 Examples of Time Domain Transforms of Various Networks
- 4.8 The Effects of Masking and Gating on Measurement Accuracy
- 4.9 Conclusions
- References
- 5 Measuring Linear Passive Devices
- 6 Measuring Amplifiers
- 6.1 Amplifiers as Linear Devices
- 6.2 Gain Compression Measurements
- 6.3 Measuring High-Gain Amplifiers
- 6.4 Measuring High-Power Amplifiers
- 6.5 Making Pulsed-RF Measurements
- 6.6 Distortion Measurements
- 6.7 Noise Figure Measurements
- 6.7.1 Definition of Noise Figure
- 6.7.2 Noise Power Measurements
- 6.7.3 Computing Noise Figure from Noise Powers
- 6.7.4 Computing DUT Noise Figure from Y-Factor Measurements
- 6.7.5 Cold-Source Methods
- 6.7.6 Noise Parameters
- 6.7.7 Error Correction in Noise Figure Measurements
- 6.7.8 Uncertainty of Noise Figure Measurements
- 6.7.9 Verifying Noise Figure Measurements
- 6.7.10 Techniques for Improving Noise Figure Measurements
- 6.8 X-Parameters, Load Pull Measurements and Active Loads
- 6.9 Conclusions on Amplifier Measurements
- References
- 7 Mixer and Frequency Converter Measurements
- 7.1 Mixer Characteristics
- 7.2 Mixers vs Frequency Converters
- 7.3 Mixers as a 12-Port Device
- 7.4 Mixer Measurements: Frequency Response
- 7.5 Calibration for Mixer Measurements
- 7.6 Mixers Measurements vs Drive Power
- 7.7 TOI and Mixers
- 7.8 Noise Figure in Mixers and Converters
- 7.9 Special Cases
- 7.10 Conclusions on Mixer Measurements
- References
- 8 VNA Balanced Measurements
- 8.1 Four-Port Differential and Balanced S-Parameters
- 8.2 Three-Port Balanced Devices
- 8.3 Measurement Examples for Mixed Mode Devices
- 8.4 True Mode VNA for Non-Linear Testing
- 8.5 Differential Testing Using Baluns, Hybrids and Transformers
- 8.6 Distortion Measurements of Differential Devices
- 8.7 Noise Figure Measurements on Differential Devices
- 8.8 Conclusions on Differential Device Measurement
- References
- 9 Advanced Measurement Techniques
- 9.1 Creating Your Own Cal Kits
- 9.2 Fixturing and De-embedding
- 9.3 Determining S-Parameters for Fixtures
- 9.4 Automatic Port Extensions
- 9.5 AFR: Fixture Removal Using Time Domain
- 9.6 Embedding Port-Matching Elements
- 9.7 Impedance Transformations
- 9.8 De-embedding High-Loss Devices
- 9.9 Understanding System Stability
- 9.10 Some Final Comments on Advanced Techniques and Measurements
- References
- Appendix A Physical Constants
- Appendix B Common RF and Microwave Connectors
- Appendix C Common Waveguides
- Appendix D Some Definitions for Calibration Kit Open and Shorts
- Index