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A 675 Mbps, 4×4 64-qam k-best mimo detector in 0.13 μm CMOS
Shabany, M.
- DOI:10.1109/TVLSI.2010.2090367
- Main Entry: Shabany, M.
- Title:A 675 Mbps, 4×4 64-qam k-best mimo detector in 0.13 μm CMOS.
- Publisher:2012.
- Abstract:This paper introduces a novel scalable pipelined VLSI architecture for a 4×4 64-QAM hard-output multiple-input-multiple-output (MIMO) detector based on K-best lattice decoders. The key contribution is a means of expanding the intermediate nodes of the search tree on-demand, rather than exhaustively, along with three types of distributed sorters operating in a pipelined structure. The proposed architecture has a fixed critical path independent of the constellation size, on-demand expansion scheme, efficient distributed sorters, and is scalable to higher number of antennas. Fabricated in 0.13 μCMOS, it occupies 0.95 μ mm} 2 core area. Operating at 282 MHz clock frequency, it dissipates 135 mW at 1.3 V supply with no BER performance loss. It achieves an SNR-independent throughput of 675 Mbps satisfying the requirements of IEEE 802.16m and long term evolution (LTE) systems. The measurements confirm that this design consumes 3.0×less energy/bit and operates at a significantly higher throughput compared to the best previously published design
- Notes:Sharif Repository
- Subject:K-best detectors.
- Subject:Long term evolution (LTE) systems.
- Subject:Multiple-input-multiple-output (MIMO) detection.
- Subject:WiMAX systems.
- Subject:802.16m.
- Subject:BER performance.
- Subject:Clock frequency.
- Subject:Constellation sizes.
- Subject:Core area.
- Subject:Critical Paths.
- Subject:Intermediate node.
- Subject:Lattice decoders.
- Subject:Long term evolution.
- Subject:MIMO detectors.
- Subject:Multiple-input-multiple-output.
- Subject:Proposed architectures.
- Subject:Search trees.
- Subject:VLSI architectures.
- Subject:Integrated circuit testing.
- Subject:Telecommunication repeaters.
- Subject:Wimax.
- Subject:Detectors.
- Added Entry:Gulak, P. G.
- Added Entry:Sharif University of Technology.
- Source: IEEE Transactions on Very Large Scale Integration (VLSI) Systems ; Volume 20, Issue 1 , December , 2012 , Pages 135-147 ; 10638210 (ISSN)
- Web Site:http://ieeexplore.ieee.org/xpl/login.jsp?tp=&arnumber=5661890&url=http%3A%2F%2Fieeexplore.ieee.org%2Fxpls%2Fabs_all.jsp%3Farnumber%3D5661890