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The basics of crystallography and diffraction
Hammond, C

اطلاعات کتابشناختی

The basics of crystallography and diffraction
Author :   Hammond, C
Publisher :   Oxford University Press,
Pub. Year  :   2015
Subjects :   Crystallography. X-ray crystallography.
Call Number :   ‭QD 905 .2 .H355 2015

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فهرست مطالب

  • Cover (1)
  • Preface to the First Edition (1997) (6)
  • Preface to the Fourth Edition (2015) (7)
  • Acknowledgements (8)
  • Contents (10)
  • X-ray photograph of zinc blende (Friedrich, Knipping, and von Laue, 1912) (17)
  • X-ray photograph of deoxyribonucleic acid (Franklin and Gosling, 1952) (18)
  • 1 Crystals and crystal structures (20)
    • 1.1 The nature of the crystalline state (20)
    • 1.2 Constructing crystals from close-packed hexagonal layers of atoms (24)
    • 1.3 Unit cells of the hcp and ccp structures (25)
    • 1.4 Constructing crystals from square layers of atoms (28)
    • 1.5 Constructing body-centred cubic crystals (28)
    • 1.6 Interstitial structures (30)
    • 1.7 Some simple ionic and covalent structures (37)
    • 1.8 Representing crystals in projection: crystal plans (39)
    • 1.9 Stacking faults and twins (39)
    • 1.10 The crystal chemistry of inorganic compounds (46)
      • 1.10.1 Bonding in inorganic crystals (47)
      • 1.10.2 Representing crystals in terms of coordination polyhedra (49)
    • 1.11 Introduction to some more complex crystal structures (51)
      • 1.11.1 Perovskite (CaTiO3), barium titanate (BaTiO3) and related structures (51)
      • 1.11.2 Tetrahedral and octahedral structures—silicon carbide and alumina (53)
      • 1.11.3 The oxides and oxy-hydroxides of iron (55)
      • 1.11.4 Silicate structures (57)
      • 1.11.5 The structures of silica, ice and water (63)
      • 1.11.6 The structures of carbon (67)
    • Exercises (73)
  • 2 Two-dimensional patterns, lattices and symmetry (75)
    • 2.1 Approaches to the study of crystal structures (75)
    • 2.2 Two-dimensional patterns and lattices (76)
    • 2.3 Two-dimensional symmetry elements (78)
    • 2.4 The five plane lattices (81)
    • 2.5 The seventeen plane groups (84)
    • 2.6 One-dimensional symmetry: border or frieze patterns (85)
    • 2.7 Symmetry in art and design: counterchange patterns (85)
    • 2.8 Layer (two-sided) symmetry and examples in woven textiles (93)
    • 2.9 Non-periodic patterns and tilings (97)
    • Exercises (102)
  • 3 Bravais lattices and crystal systems (105)
    • 3.1 Introduction (105)
    • 3.2 The fourteen space (Bravais) lattices (105)
    • 3.3 The symmetry of the fourteen Bravais lattices: crystal systems (109)
    • 3.4 The coordination or environments of Bravais lattice points: space-filling polyhedra (111)
    • Exercises (116)
  • 4 Crystal symmetry: point groups, space groups, symmetry-related properties and quasiperiodic crystals (118)
    • 4.1 Symmetry and crystal habit (118)
    • 4.2 The thirty-two crystal classes (120)
    • 4.3 Centres and inversion axes of symmetry (121)
    • 4.4 Crystal symmetry and properties (125)
    • 4.5 Translational symmetry elements (129)
    • 4.6 Space groups (132)
    • 4.7 Bravais lattices, space groups and crystal structures (139)
    • 4.8 The crystal structures and space groups of organic compounds (142)
      • 4.8.1 The close packing of organic molecules (143)
      • 4.8.2 Long-chain polymer molecules (146)
    • 4.9 Quasicrystals (quasiperiodic crystals or crystalloids) (148)
    • Exercises (153)
  • 5 Describing lattice planes and directions in crystals: Miller indices and zone axis symbols (154)
    • 5.1 Introduction (154)
    • 5.2 Indexing lattice directions—zone axis symbols (155)
    • 5.3 Indexing lattice planes—Miller indices (156)
    • 5.4 Miller indices and zone axis symbols in cubic crystals (159)
    • 5.5 Lattice plane spacings, Miller indices and Laue indices (160)
    • 5.6 Zones, zone axes and the zone law, the addition rule (162)
      • 5.6.1 The Weiss zone law or zone equation (162)
      • 5.6.2 Zone axis at the intersection of two planes (162)
      • 5.6.3 Plane parallel to two directions (163)
      • 5.6.4 The addition rule (163)
    • 5.7 Indexing in the trigonal and hexagonal systems: Weber symbols and Miller-Bravais indices (164)
    • 5.8 Transforming Miller indices and zone axis symbols (167)
    • 5.9 Transformation matrices for trigonal crystals with rhombohedral lattices (170)
    • 5.10 A simple method for inverting a 3 × 3 matrix (171)
    • Exercises (172)
  • 6 The reciprocal lattice (174)
    • 6.1 Introduction (174)
    • 6.2 Reciprocal lattice vectors (174)
    • 6.3 Reciprocal lattice unit cells (176)
    • 6.4 Reciprocal lattice cells for cubic crystals (180)
    • 6.5 Proofs of some geometrical relationships using reciprocal lattice vectors (182)
      • 6.5.1 Relationships between a, b, c and a*, b*, c* (182)
      • 6.5.2 The addition rule (183)
      • 6.5.3 The Weiss zone law or zone equation (183)
      • 6.5.4 d-spacing of lattice planes (hkl) (184)
      • 6.5.5 Angle ρ between plane normals (h1k1l1) and (h2k2l2) (184)
      • 6.5.6 Definition of a*, b*, c* in terms of a, b, c (185)
      • 6.5.7 Zone axis at intersection of planes (h1k1l1) and (h2k2l2) (185)
      • 6.5.8 A plane containing two directions [u1v1w1] and [u2v2w2] (185)
    • 6.6 Lattice planes and reciprocal lattice planes (185)
    • 6.7 Summary (188)
    • Exercises (188)
  • 7 The diffraction of light (189)
    • 7.1 Introduction (189)
    • 7.2 Simple observations of the diffraction of light (191)
    • 7.3 The nature of light: coherence, scattering and interference (196)
    • 7.4 Analysis of the geometry of diffraction patterns from gratings and nets (199)
    • 7.5 The resolving power of optical instruments: the telescope, camera, microscope and the eye (206)
    • Exercises (216)
  • 8 X-ray diffraction: the contributions of Max von Laue, W. H. and W. L. Bragg and P. P. Ewald (217)
    • 8.1 Introduction (217)
    • 8.2 Laue's analysis of X-ray diffraction: the three Laue equations (218)
    • 8.3 Bragg's analysis of X-ray diffraction: Bragg's law (221)
    • 8.4 Ewald's synthesis: the reflecting sphere construction (223)
    • Exercises (228)
  • 9 The diffraction of X-rays (229)
    • 9.1 Introduction (229)
    • 9.2 The intensities of X-ray diffracted beams: the structure factor equation and its applications (233)
    • 9.3 The broadening of diffracted beams: reciprocal lattice points and nodes (242)
      • 9.3.1 The Scherrer equation: reciprocal lattice points and nodes (242)
      • 9.3.2 Integrated intensity and its importance (246)
      • 9.3.3 Crystal size and perfection: mosaic structure and coherence length (246)
    • 9.4 Fixed θ, varying λ X-ray techniques: the Laue method (247)
    • 9.5 Fixed λ, varying θ X-ray techniques: oscillation, rotation and precession methods (250)
      • 9.5.1 The oscillation method (251)
      • 9.5.2 The rotation method (253)
      • 9.5.3 The precession method (254)
    • 9.6 X-ray diffraction from single crystal thin films and multilayers (258)
    • 9.7 X-ray (and neutron) diffraction from ordered crystals (262)
    • 9.8 Practical considerations: X-ray sources and recording techniques (265)
      • 9.8.1 The generation of X-rays in X-ray tubes (266)
      • 9.8.2 Synchrotron X-ray generation (267)
      • 9.8.3 X-ray recording techniques (268)
    • Exercises (268)
  • 10 X-ray diffraction of polycrystalline materials (271)
    • 10.1 Introduction (271)
    • 10.2 The geometrical basis of polycrystalline (powder) X-ray diffraction techniques (272)
      • 10.2.1 Intensity measurement in the X-ray diffractometer (277)
      • 10.2.2 Back reflection and Debye–Scherrer powder techniques (279)
    • 10.3 Some applications of X-ray diffraction techniques in polycrystalline materials (281)
      • 10.3.1 Accurate lattice parameter measurements (281)
      • 10.3.2 Identification of unknown phases (282)
      • 10.3.3 Measurement of crystal (grain) size (285)
      • 10.3.4 Measurement of internal elastic strains (285)
    • 10.4 Preferred orientation (texture, fabric) and its measurement (286)
      • 10.4.1 Fibre textures (287)
      • 10.4.2 Sheet textures (288)
    • 10.5 X-ray diffraction of DNA: simulation by light diffraction (291)
    • 10.6 The Rietveld method for structure refinement (296)
    • Exercises (299)
  • 11 Electron diffraction and its applications (302)
    • 11.1 Introduction (302)
    • 11.2 The Ewald reflecting sphere construction for electron diffraction (303)
    • 11.3 The analysis of electron diffraction patterns (307)
    • 11.4 Applications of electron diffraction (309)
      • 11.4.1 Determining orientation relationships between crystals (309)
      • 11.4.2 Identification of polycrystalline materials (311)
      • 11.4.3 Identification of quasiperiodic crystals (quasicrystals) (311)
    • 11.5 Kikuchi and electron backscattered diffraction (EBSD) patterns (313)
      • 11.5.1 Kikuchi patterns in the TEM (313)
      • 11.5.2 Electron backscattered diffraction (EBSD) patterns in the SEM (317)
    • 11.6 Image formation and resolution in the TEM (319)
    • Exercises (323)
  • 12 The stereographic projection and its uses (327)
    • 12.1 Introduction (327)
    • 12.2 Construction of the stereographic projection of a cubic crystal (330)
    • 12.3 Manipulation of the stereographic projection: use of the Wulff net (333)
    • 12.4 Stereographic projections of non-cubic crystals (336)
    • 12.5 Applications of the stereographic projection (339)
      • 12.5.1 Representation of point group symmetry (339)
      • 12.5.2 Representation of orientation relationships (341)
      • 12.5.3 Representation of preferred orientation (texture or fabric) (342)
      • 12.5.4 Trace analysis (344)
    • Exercises (347)
  • 13 Fourier analysis in diffraction and image formation (348)
    • 13.1 Introduction—Fourier series and Fourier transforms (348)
    • 13.2 Fourier analysis in crystallography (351)
      • 13.2.1 X-ray resolution of a crystal structure (356)
    • 13.3 The structural analysis of crystals and molecules (357)
      • 13.3.1 Trial and error methods (358)
      • 13.3.2 The Patterson function: Patterson or vector maps (359)
      • 13.3.3 Interpretation of Patterson maps: heavy atom and isomorphous replacement techniques (365)
      • 13.3.4 Direct methods (367)
      • 13.3.5 Charge flipping (368)
    • 13.4 Analysis of the Fraunhofer diffraction pattern from a grating (369)
    • 13.5 Abbe theory of image formation (375)
  • 14 The physical properties of crystals and their description by tensors (381)
    • 14.1 Introduction (381)
    • 14.2 Second rank tensor properties (382)
      • 14.2.1 General expression for a second rank tensor relating two vectors (382)
      • 14.2.2 Simplification of second rank tensor equations: principal axes (385)
      • 14.2.3 Representation of second rank tensor properties: the representation quadric (385)
    • 14.3 Neumann's principle (387)
      • 14.3.1 Pyroelectricity and ferroelectricity (388)
    • 14.4 Second rank tensors that describe stress and strain (388)
      • 14.4.1 The stress tensor: principal axes (eigenvectors) and principal values (eigenvalues) (388)
      • 14.4.2 The strain tensor, Neumann's principle, and thermal expansion (391)
      • 14.4.3 Atomic displacement parameters (ADPs) (393)
    • 14.5 The optical properties of crystals (393)
    • 14.6 Third rank tensors: piezoelectricity (398)
    • 14.7 Fourth rank tensor properties: elasticity (399)
    • Exercises (401)
  • Appendix 1 Computer programs, models and model-building in crystallography (404)
  • Appendix 2 Polyhedra in crystallography (412)
  • Appendix 3 Biographical notes on crystallographers and scientists mentioned in the text (422)
  • Appendix 4 Some useful crystallographic relationships (468)
  • Appendix 5 A simple introduction to vectors and complex numbers and their use in crystallography (471)
  • Appendix 6 Systematic absences (extinctions) in X-ray diffraction and double diffraction in electron diffraction patterns (478)
  • Appendix 7 Group theory in crystallography (488)
  • Answers to exercises (500)
  • Further Reading (516)
  • Index (526)
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