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A fast and simple method to detect short circuit fault in cascaded H-bridge multilevel inverter
Ouni, S.
- DOI:10.1109/ICIT.2015.7125206
- Main Entry: Ouni, S.
- Title:A fast and simple method to detect short circuit fault in cascaded H-bridge multilevel inverter.
- Publisher:Institute of Electrical and Electronics Engineers Inc, 2015.
- Abstract:Fault detection is one of the most important tasks in fault tolerant converters. In this paper, a new method is proposed to detect the faulty cell in a cascaded H-bridge multilevel inverter. The detection technique is based on comparison of the output voltage with reference voltage made by using switching control pulses and DC-Link voltage. Because of the simplicity of this method, it is possible to use a single field-programmable gate array (FPGA) to implement this method and inverter control. The simulation and experimental results confirm the effectiveness of the proposed fault detection technique
- Notes:Sharif Repository
- Subject:Cascaded H-Bridge Inverter.
- Subject:Bridge circuits.
- Subject:Electric inverters.
- Subject:Field programmable gate arrays (FPGA)
- Subject:Logic gates.
- Subject:Cascaded H-bridge inverters.
- Subject:Cascaded h-bridge multilevel inverters.
- Subject:DC-link voltages.
- Subject:Fault detection techniques.
- Subject:Fault-tolerant converters.
- Subject:Reference voltages.
- Subject:Short-circuit fault.
- Subject:Switching Control.
- Subject:Fault detection.
- Added Entry:Rodriguez, J.
- Added Entry:Shahbazi, M.
- Added Entry:Zolghadri, M. R.
- Added Entry:Schmeisser, U.
- Added Entry:Oraee, H.
- Added Entry:Lezana, P.
- Added Entry:Ulloa Schmeisser, A.
- Added Entry:Sharif University of Technology.
- Added Entry:2015 IEEE International Conference on Industrial Technology, ICIT 2015, 17 March 2015 through 19 March 2015
- Added Entry:ICIT 2015
- Source: Proceedings of the IEEE International Conference on Industrial Technology, 17 March 2015 through 19 March 2015 ; Volume 2015-June, Issue June , 2015 , Pages 866-871
- Web Site:http://ieeexplore.ieee.org/document/7125206