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Experimental evaluation of three concurrent error detection mechanisms
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Experimental evaluation of three concurrent error detection mechanisms

Vahdatpour, A.

  1. DOI:10.1109/ICM.2006.373268
  2. Main Entry: Vahdatpour, A.
  3. Title:Experimental evaluation of three concurrent error detection mechanisms.
  4. Publisher:2006.
  5. Abstract:This paper presents an experimental evaluation of the effectiveness of three hardware-based control flow checking mechanisms, using software-implemented fault injection (SWIFI) method. The fault detection technique uses reconfigurable of the shelf FPGAs to concurrently check the execution flow of the target program. The technique assigns signatures to the target program in the compile time and verifies the signatures using a FPGA as a watchdog processor to detect possible violation caused by the transient faults. A total of 3000 faults were injected in the experimental embedded system, which is based on an 8051 microcontroller, to measure the error detection coverage. The experimental results show that these mechanisms detect about 90% of transient errors, injected by software implemented method. © 2006 IEEE
  6. Notes:Sharif Repository
  7. Subject:Electronics industry.
  8. Subject:Embedded systems.
  9. Subject:Error detection.
  10. Subject:Fault detection.
  11. Subject:Field programmable gate arrays (FPGA)
  12. Subject:Integrated circuits.
  13. Subject:Mechanisms.
  14. Subject:Microelectronics.
  15. Subject:Program processors.
  16. Subject:Compile time.
  17. Subject:Concurrent error detection (CED)
  18. Subject:Control flow checking.
  19. Subject:Detection coverage.
  20. Subject:Detection techniques.
  21. Subject:Execution flow.
  22. Subject:Experimental evaluations.
  23. Subject:Experimental results.
  24. Subject:Fault-injection.
  25. Subject:International conferences.
  26. Subject:Micro-controller.
  27. Subject:Re-configurable.
  28. Subject:Transient errors.
  29. Subject:Transient faults.
  30. Subject:Watchdog processors.
  31. Subject:Concurrency control.
  32. Added Entry:Fazeli, M.
  33. Added Entry:Miremadi, S. G.
  34. Added Entry:Sharif University of Technology.
  35. Added Entry:Proceedings of the International Conference on Microelectronics, ICM, 16 December 2006 through 19 December 2006, Dhahran
  36. Source: 2006 International Conference on Microelectronics, ICM 2006, Dhahran, 16 December 2006 through 19 December 2006 ; 2006 , Pages 67-70 ; 1424407656 (ISBN); 9781424407651 (ISBN)
  37. Web Site:https://ieeexplore.ieee.org/document/4243649

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