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A solution to single point of failure using voter replication and disagreement detection
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A solution to single point of failure using voter replication and disagreement detection

Patooghy, A.

  1. DOI:10.1109/DASC.2006.15
  2. Main Entry: Patooghy, A.
  3. Title:A solution to single point of failure using voter replication and disagreement detection.
  4. Publisher:2006.
  5. Abstract:This paper suggests a method, called distributed voting, to overcome the problem of the single point of failure in a TMR system used in robotics and industrial control applications. It uses time redundancy and is based on TMR with disagreement detector feature. This method masks faults occurring in the voter where the TMR system can continue its function properly. The method has been evaluated by injecting faults into Vertex2Pro and Vertex4 Xilinx FPGAs. An analytical evolution is also performed. The results of both evaluation approaches show that the proposed method can improve the reliability and the mean time to failure (MTTF) of a TMR system by at least a factor of (2-R v(t)) where Rv(t) is the reliability of the voter. © 2006 IEEE
  6. Notes:Sharif Repository
  7. Subject:Field programmable gate arrays (FPGA)
  8. Subject:Problem solving.
  9. Subject:Reliability.
  10. Subject:Robotics.
  11. Subject:Disagreement detection.
  12. Subject:Industrial control applications.
  13. Subject:Mean time to failure (MTTF)
  14. Subject:Voter replication.
  15. Subject:Distributed computer systems.
  16. Added Entry:Miremadi, S. Gh.
  17. Added Entry:Javadtalab, A.
  18. Added Entry:Fazeli, M.
  19. Added Entry:Farazmand, N.
  20. Added Entry:Sharif University of Technology.
  21. Added Entry:Proceedings - 2nd IEEE International Symposium on Dependable, Autonomic and Secure Computing, DASC 2006, 29 September 2006 through 1 October 2006, Indianapolis, IN
  22. Source: 2nd IEEE International Symposium on Dependable, Autonomic and Secure Computing, DASC 2006, Indianapolis, IN, 29 September 2006 through 1 October 2006 ; 2006 , Pages 171-176 ; 0769525393 (ISBN); 9780769525396 (ISBN)
  23. Web Site:https://ieeexplore.ieee.org/document/4030880

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